Low-Pass NGD Numerical Function and STM32 MCU Emulation Test
نویسندگان
چکیده
This article introduces an original microcontroller unit (MCU) design of numerical low-pass (LP) negative group delay (NGD) function. The innovative theory the LP-NGD function is developed based on first-order analog transfer discretization. infinite impulse response (IIR) fundamentally formulated in desired NGD value, cutoff frequency, gain, and MCU sampling frequency. A STM32 proof-of-concept (POC) tested to implement IIR Different real-time tests with visualization input output signals from POC were performed. As expected, time-advance demonstration milli-second short- several hour long-duration time-scale arbitrary waveform temperature humidity sensors. signal not contradiction causality. proposed digital opens a potential future industrial application via sensored anticipation.
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ژورنال
عنوان ژورنال: IEEE Transactions on Industrial Electronics
سال: 2022
ISSN: ['1557-9948', '0278-0046']
DOI: https://doi.org/10.1109/tie.2021.3109543